New Starrett AVR-FOV 0.14X Multi-Sensor Vision System offers micron level accuracy across a wide range of gear sizes. (Courtesy: The L.S. Starrett Company)
making the inspection process faster and more user friendly, the partnership between system manufacturer and end user has never beenmore important. Metrology-systemmanufacturers have a staff of highly trained experts that can help companies determine which systems best suit their needs, such as what lens configurations will serve them best, which lighting and touch probe options will help, and what accessories or custom options might also help them reach their goals. Some system manufacturers also have product special- ists in the field who can assist with the best metrology option to be selected, as well as provide post sale support. Proper installation and calibration of the systems ensure accurate results are obtained. Training company employees is equally impor- tant tomake sure themany features and programs of themetrology systems are used to their full potential. When technical questions arise and regular service is needed, the system manufacturer can provide guidance about the bestmethods and techniques to optimize systemperformance. Thismay be via phone, online connection, or in person on-site. When a company invests in amulti-sensor metrology system, they are forming a true partnership with the manufacturer that is equally important, if notmore so, than the equipment itself.
Gear manufacturers can use the line, radius, and circle annota- tion in MetLogix M3 software to create a part inspection program for an individual gear tooth profile or an entire gear. Programmable light output options can be built into the program as defined steps, including being called up as the part recognition program initiates. Once the program is created, placing that part within the camera’s field-of-view allows for the saved program to initiate and run the inspection. A Renishaw Touch Probe may also be used for quick acquisition of discreet points along a part’s profile as well as Z-axis measurements. These advancements, when combinedwithCNC control, advanced edge detection, and one-touch measurement, facilitate what is known as “walk-upmetrology.”Walk-upmetrology enables multiple operators, including those right on the shop floor, to use the same system for a variety of applications. This versatility and ease-of-use significantly helps with bottlenecks in the inspection process and dramatically increases speed-of-workflow efficiency. SUPPORT While the many advances in multi-sensor metrology systems are
ABOUT THE AUTHOR Greg Maisch is an engineering manager with The L.S. Starrett Co. Metrology Division. Starrett optical comparators, vision and multi-sensor metrology systems, laser measurement systems, force measurement and material testing, precision hand tools, gage blocks, hand tools, power tool accessories and saws provide exceptional quality capable of producing dependable and accurate results time and time again. For more information, go to www.starrett.com.
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