Albis Optoelectronics Presents 20 GHz High Power Photodiode Module
Albis Optoelectronics is a leading designer, developer and manufacturer of high-speed photodiodes. Since more than 15 years, the company has offered the broadest portfolio of Telcordia qualified InP and GaAs photodiodes for datacom and telecom applications in the industry. At the upcoming ECOC in Dublin, Albis will present its new high power, highly linear microwave photodetector, designed for direct optical- to-electrical conversion of RF-modulated optical signals at 20 GHz. The small, rugged and hermetic PQW package makes the detector suitable for installation in systems operated under severe environmental conditions. The photodiode inside this module is a high power, high linearity Albis photodiode chip, designed to operate over a wide range of wavelengths from 1260 to 1620 nm. This photodiode is also available mounted on an AlN carrier. It offers a typical bandwidth of 22 GHz for photocurrents up to 50 mA, a responsivity of 0.5 A/W and high linearity of +30 dBm OIP3 @ 20 GHz, 30 mA. Typical applications include analogue optical links, microwave photonics and radio-over-fibre. All photodiode products are manufactured in-house in Albis’ dedicated clean-room facilities. Product highlights include: PIN photodiodes for 10G, 25G and 40G digital and analogue receivers. Low bias, top illuminated APDs for 2.5G and 10G OLT/ONUs. 25G APDs for 28 Gbaud PAM-4 and 100GBASE-ER4 applications. Side-illuminated monitor diodes and monitor diode arrays. Photodiodes with integrated
lenses and optical filters. And last but not least hermetically packaged, short and long wavelength microwave photodetectors up to 30 GHz. Find out more by visiting our Booth #166!
The Calnex Luceo test systems allows high-speed optical manufacturers to be compliant with the IEEE Stress testing requirements in an affordable and practical way. The Calnex Luceo stress-test system is calibrated in the factory, which means there is no need for the time-consuming calibration for each test run as is the case with other stress-test systems. With the acquisition of LUCEO Technologies in May 2019, CALNEX SOLUTIONS a global leader in test & measurement now allows this product line to be supported globally with a network of sales and support facilities. IEEE requires stress testing for 100G and CALNEX sets a new standard for receiver stress testing
400G optical components. With many IEEE test solutions either too expensive or low quality, alternatives are essential. Calnex’s Luceo product line enables a customer to buy only what they need at a reasonable price. The Calnex Luceo system allows the user to select which functions to purchase, be it the Jitter-only (DJ and RJ) module, a Clock source with or without sine jitter or just a pattern generator or error detector. The jitter and VEC modules can even be
used with any existing BERT that meets the clocking requirements. Other functions such as optical power meter, optical attenuator, clock dividers, clock recovery optical switches and more can be added as well. A complete set of optical test functions in one mainframe. A new, practical and affordable way to be IEEE compliant and open up sales to new customers that demand this compliance. For more info, email email@example.com
| ISSUE 18 | Q3 2019
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